In addition, polished SiC wafer was also examined by optical microscopy with transmission mode, and it is found that there are some typical defects, such as negative crystals, micropipes, carbon particles in.
采用透射模式对抛光晶片进行观察 ,发现了SiC晶体内的典型缺陷 ,如 :负晶、微管、碳颗粒等 ,并对它们的形成机理进行了讨论。
In contrast with the detected space group of the crystal,the newly discovered ditrigonal scalenohedral negative crystal inclusions showed the m symmetry of the crystal with space group symmetry Rc.
晶体中发现复三方偏三角面体的负晶包裹体,其宏观对称属m,它与空间群Rc相对应,但与测出晶体结构的空间群有矛盾。
