The X-ray fluorescence tomography method is capable of virtually estimating the concentration of elements and obtaining the inner structure of materials by measuring the intensity of fluorescence which is emitted by the inner shell electron.
X射线荧光层析技术是利用内壳层电子跃迁所发出荧光辐射,来测定样品中的元素含量,获取样品内部的结构信息。
The imaging principle of X-ray fluorescent tomography and its application in microanalysis field are introduced simply .
介绍了X射线荧光层析成像技术的成像原理及其在微量分析领域中的应用。
