The Auger electron spectrometer (AES) is used to study the element depth Profile of rapid thermal nitridation SiO2 (RTN SiO2) film and jpost oxidation annealing SiO2 (PNA SiO2) film.
应用俄歇电子能谱仪，对快速热氮化法制备的热氮化二氧化硅（ＲＴＮＳｉＯ２）薄膜及快速热氮化后再氧化退火的二氧化硅（ＰＮＡＳｉＯ２）薄膜，进行元素深度分布剖析。
The molybdate composite conversion films on aluminium were prepared by anodic spark oxidation (ASO) technology.
采用阳极火花氧化处理技术,在含有钼酸盐等金属盐的碱性电解液中,通过阳极氧化在铝表面形成了复合转化膜。
